Our wafer probes set the industry standard for performance. DMPI designs, manufactures and sells millimeter and sub-millimeter wavelength on-wafer ground-signal-ground probes and associated components for electrical measurement of devices and materials. We have developed a scalable approach for the manufacturing of phsyically robust micro machined probes with low-insertion loss coupling to the DUT and DC biasing of probed circuits. The Si probe chip is mounted in a machined waveguide split block, allowing for drop-in replacement of the probe chip without needing replacement of the entire block module. If the outer metal block package isundamaged (block damage is a rare event), the probe can typically be repaired within one week, and can be repaired numerous times (we have been using test blocks for several years with over a hundred probe replacements, i.e., repairs). Repaira have typical performance "as new".
From our Machined Probe (MPR) line: WR1.5, WR2.2, WR3.4, WR4.3 and WR5.1 DMProbes are available to order.
* Second Generation V02WR1.5 MPR with probe pitch of 25 um
WR1p5 DMProbe, with GPPO to SMA dc bias connector/cable,
direct waveguide connected to a VDI VNA Extender
Product Returns for Repairs: Information & Pricing